Mmastodon WorldWorld first seen 21 h ago, last 21 h ago, peak #11
Hitachi High-Tech and ZEISS accelerate next-generation defect inspection tool
Original: 『複数の 電子線から 大量の 画像データが 生成される』 10nm以下の欠陥を数十倍の速度で検査、日立ハイテクとZEISSが次世代検査装置の開発を加速 https:// news.mynavi.jp/techplus/articl e/20
Hitachi High-Tech and ZEISS are speeding up development of a next-generation semiconductor inspection device that uses multiple electron beams to generate large volumes of image data. The tool can detect defects smaller than 10 nanometers at speeds tens of times faster than conventional systems, addressing inspection bottlenecks in advanced chip manufacturing.
Why now: The chip industry urgently needs faster inspection of ever-smaller defects as semiconductor nodes shrink.
Hitachi High-TechZEISSsemiconductor manufacturing
Evidence
- 『複数の 電子線から 大量の 画像データが 生成される』 10nm以下の欠陥を数十倍の速度で検査、日立ハイテクとZEISSが次世代検査装置の開発を加速 https:// news.mynavi.jp/techplus/articl e/20261001-5052594/ # 短歌を検出する人 # news # bot · tanka@mastodon.crazynewworld.net · 2
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